Template:Scanning Probe Microscopy in Modern Nanotechnology (part 2)

From NERM 2010
Revision as of 04:09, 1 June 2010 by Walkerma (talk | contribs) (Create page)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to: navigation, search

Friday, June 4, 8:30 AM - 12:00 PM

Scanning Probe Microscopy in Modern Nanotechnology
Kellas 101

Organizer/Presider: Igor Sokolov

8:30 Introductory Remarks

8:35      Sample-Independent Lateral Force Calibration. E. Anderson1, T. Esformes1, and N.A. Burnham1, Department of Physics, Worcester Polytechnic Institute, Worcester MA 01609

9:05 300 AFM-Based Scanning Mirowave Microscopy and Its Application to Studies of Metal-Insulator Transition in VO2. Alexander Tselev, Oak Ridge National Laboratory

9:45 301 Peak Force Tapping & Quantitative Mechanical Mapping with Single Molecule Resolution. John Thornton, Veeco Instruments

10:25 Intermission

10:40 302 AFM To Study Electron Photoemission from Single Quantum Dots for Solar Cells and Memory Applications. Nataliia Guz, Maxim Dokukin and Igor Sokolov, Clarkson University

11:00 303 Which Fractal Parameter Most Determines Adhesion?. Nancy A. Burnham1, Deli Liu1 and Jack Martin2, (1)Worcester Polytechnic Institute, (2)Analog Devices Inc

11:40 304 Atomic Force Microscopy To Detect Internal Live Processes in Insects. Maxim Dokukin1, Nataliia Guz1, Sergey Vasilyev1 and Igor Sokolov1,2, (1)Clarkson University, (2)Clarkson University

Retrieved from "https://wiki.potsdam.edu/nerm2010/index.php?title=Template:Scanning_Probe_Microscopy_in_Modern_Nanotechnology_(part_2)&oldid=1308"