Scanning probe microscopy in modern nanotechnology

NERM June 2 - 5, 2010 POTSDAM
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Scanning Probe microscopy (SPM) is one of the major tools responsible for the emergence of what is called “Nanoscience and Nanotechnology”. Various high-resolution SPM techniques proved to be capable of probing local electrical, magnetic, chemical, mechanical, optical and thermal properties of matter at the nanoscale level as well as changing these properties in a controlled manner. We observe now a tremendous proliferation of the areas of SPM applications in condensed matter, materials science, chemistry, bioengineering and nanotechnology. Your contributions are invited in all areas of SPM techniques related to study materials and processes at nanoscale, in particular:

• Novel development of SMP techniques
• SPM in biological and biomolecular applications
• SPM in application to nanotechnology

Session organizer

Prof. Igor Sokolov is professor of chemistry at Clarkson University, and director of the NanoBioLaboratory at Clarkson.

Session sponsors

This session is sponsored by Veeco, Inc., manufacturer of atomic force microscopes and other instruments for nanotechnology.

Confirmed speakers

• Prof. Todd Gross (University of New Hampshire)
• Prof. Zoya Leonenko (University of Waterloo).
• Prof. Andrew Pelling (University of Ottawa)
• Prof. Terri Camesano (Worcester Polytechnic Institute)
• Dr. S.B. Kaemmer (Veeco, Inc.)
• Prof. Chuan-Jian Zhong (SUNY Binghamton)
• Dr.. A. Tselev (Oak Ridge National Laboratory)
• Prof. Nancy A. Burnham (Worcester Polytechnic Institute)
• Prof. Dawn A. Bonnell (University of Pennsylvania)