Scanning probe microscopy in modern nanotechnology
Scanning Probe microscopy (SPM) is one of the major tools responsible for the emergence of what is called “Nanoscience and Nanotechnology”. Various high-resolution SPM techniques proved to be capable of probing local electrical, magnetic, chemical, mechanical, optical and thermal properties of matter at the nanoscale level as well as changing these properties in a controlled manner. We observe now a tremendous proliferation of the areas of SPM applications in condensed matter, materials science, chemistry, bioengineering and nanotechnology. Your contributions are invited in all areas of SPM techniques related to study materials and processes at nanoscale, in particular:
- Novel development of SMP techniques
- SPM in biological and biomolecular applications
- SPM in application to nanotechnology
Session organizer
Prof. Igor Sokolov is professor of chemistry at Clarkson University, and director of the NanoBioLaboratory at Clarkson.
Session sponsors
This session is sponsored by Veeco, Inc., manufacturer of atomic force microscopes and other instruments for nanotechnology.
Confirmed speakers
- Prof. Todd Gross, Chair, Department of Mechanical Engineering, University of New Hampshire.
- Prof. Zoya Leonenko, Waterloo Institute for Nanotechnology, University of Waterloo, Ontario.
- Prof. Andrew Pelling, Department of Physics, University of Ottawa.
- Prof. Terri Camesano,Dept. of Chemical Engineering, Worcester Polytechnic Institute.
- Dr. S.B. Kaemmer (Veeco, Inc.)
- Prof. Chuan-Jian Zhong, Dept. of Chemistry, SUNY Binghamton.
- Dr.. A. Tselev (Oak Ridge National Laboratory)
- Prof. Nancy A. Burnham, Dept. of Physics, Worcester Polytechnic Institute.
- Prof. Dawn A. Bonnell, Dept. of Materials Science & Engineering, University of Pennsylvania.
